• DocumentCode
    837182
  • Title

    A quasi-TEM analysis for curved and straight planar multiconductor systems

  • Author

    Diestel, Heinrich

  • Author_Institution
    Siemens AG, Munich, West Germany
  • Volume
    37
  • Issue
    4
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    748
  • Lastpage
    753
  • Abstract
    A quasi-TEM (transverse electromagnetic) analysis for straight and weakly curved planar multiconductor transmission lines is presented. This transverse field of a weakly curved planar multiconductor system is described by the static electric and magnetic solutions of the corresponding axially symmetrical structure. The capacitance and inductance matrices of this system of concentric microstrip rings are calculated using the method of lines. A two-port network consisting of circularly curved transmission lines is calculated and the results are compared with measured values. It is concluded that the proposed method of approximation is suited for analysis of microwave components as well as for high-speed digital circuits with interconnections consisting of curved striplines instead of straight lines with discontinuities
  • Keywords
    S-parameters; matrix algebra; strip lines; waveguide theory; approximation method; axially symmetrical structure; capacitance matrices; circularly curved transmission lines; concentric microstrip rings; curved striplines; high-speed digital circuits; inductance matrices; interconnections; lines method; microwave components; planar multiconductor systems; quasi-TEM analysis; scattering parameters; straight transmission lines; transverse electromagnetic analysis; transverse field; two-port network; Capacitance; Distributed parameter circuits; Electromagnetic analysis; Inductance; Magnetic analysis; Microstrip; Multiconductor transmission lines; Planar transmission lines; Symmetric matrices; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.18849
  • Filename
    18849