Title :
Algorithm-level recomputing with shifted operands-a register transfer level concurrent error detection technique
Author :
Wu, Kaijie ; Karri, Ramesh
Author_Institution :
Electron. & Commun. Eng., Univ. of Illinois, Chicago, IL, USA
fDate :
3/1/2006 12:00:00 AM
Abstract :
This paper presents Algorithm-level REcomputing with Shifted Operands (ARESO), which is a new register transfer (RT) level time redundancy-based concurrent error detection (CED) technique. In REcomputing with Shifted Operands (RESO), operations (additions, subtractions, etc.) are carried out twice-once on the basic input and once on the shifted input. Results from these two operations are compared to detect an error. Although using RESO operators in RT-level designs is straightforward, it entails time and area overhead. In contrast, ARESO does not use specialized RESO operators. In ARESO, an algorithm is carried out twice-once on the basic input and once on the shifted input. Results from these two algorithm-level instantiations are compared to detect an error. By operating at the algorithm level, ARESO exploits RT-level scheduling, pipelining, operator chaining, and multicycling to incorporate user-specified error detection latencies. ARESO supports hardware versus performance versus error detection latency tradeoffs. The authors validated ARESO on practical design examples using the Synopsys Behavior Compiler (BC). An industry standard behavioral synthesis system.
Keywords :
concurrent engineering; error detection; fault diagnosis; high level synthesis; shift registers; transfer functions; RESO operators; algorithm-level recomputing; concurrent error detection technique; high-level synthesis; register transfer level scheduling; shifted operands; single-event upsets; time redundancy; user-specified error detection latency; Circuit faults; Clocks; Combinational circuits; Delay; Frequency; Logic devices; Power supplies; Sequential circuits; Single event upset; Very large scale integration; Concurrent error detection; high-level synthesis; register transfer level; single-event upsets; time redundancy;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.853694