An automated and efficient substrate noise analysis tool

Author

Li, Hongmei ; Zemke, Cole E. ; Manetas, Giorgos ; Okhmatovski, Vladimir I. ; Rosenbaum, Elyse ; Cangellaris, Andreas C.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA

Volume

25

Issue

3

fYear

2006

fDate

3/1/2006 12:00:00 AM

Firstpage

454

Lastpage

468

Abstract

This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green´s function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools.

Keywords

Green´s function methods; VLSI; boundary-elements methods; circuit analysis computing; integrated circuit modelling; integrated circuit noise; substrates; system-on-chip; automated substrate noise analysis tool; boundary element method solver; closed form Green functions; global surface impedance matrix scheme; netlist extractor; nonuniform doped substrates; substrate noise coupling; system on a chip; very large scale integrated circuits; Boundary element methods; Circuit simulation; Coupling circuits; Implants; Integrated circuit modeling; Semiconductor device noise; Substrates; Surface impedance; System-on-a-chip; Very large scale integration; Circuit; layout; modeling; noise analysis; simulation; substrate; system on a chip; very large scale integrated (VLSI);

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2005.854628

Filename

1597381