• DocumentCode
    83728
  • Title

    Invariant Scattering Convolution Networks

  • Author

    Bruna, Joan ; Mallat, S.

  • Author_Institution
    Courant Inst., New York Univ., New York, NY, USA
  • Volume
    35
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1872
  • Lastpage
    1886
  • Abstract
    A wavelet scattering network computes a translation invariant image representation which is stable to deformations and preserves high-frequency information for classification. It cascades wavelet transform convolutions with nonlinear modulus and averaging operators. The first network layer outputs SIFT-type descriptors, whereas the next layers provide complementary invariant information that improves classification. The mathematical analysis of wavelet scattering networks explains important properties of deep convolution networks for classification. A scattering representation of stationary processes incorporates higher order moments and can thus discriminate textures having the same Fourier power spectrum. State-of-the-art classification results are obtained for handwritten digits and texture discrimination, with a Gaussian kernel SVM and a generative PCA classifier.
  • Keywords
    Gaussian processes; convolution; handwritten character recognition; image classification; image representation; image texture; principal component analysis; support vector machines; wavelet transforms; Fourier power spectrum; Gaussian kernel SVM; SIFT-type descriptors; averaging operators; complementary invariant information; deep convolution networks; deformations; generative PCA classifier; handwritten digits; high-frequency information; invariant scattering convolution networks; mathematical analysis; network layer; nonlinear modulus; scattering representation; state-of-the-art classification; stationary process; texture discrimination; translation invariant image representation; wavelet scattering network; wavelet transform convolutions; Computer architecture; Convolution; Fourier transforms; Scattering; Wavelet coefficients; Classification; convolution networks; deformations; invariants; wavelets;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2012.230
  • Filename
    6522407