Title :
A two-dimensional resistance simulator using the boundary element method
Author :
Wang, Zeyi ; Wu, Qiming
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
fDate :
4/1/1992 12:00:00 AM
Abstract :
A resistance simulator for extraction of the parasitic parameters from VLSI layout is presented. The calculation of the resistor network is based on the boundary element method (BEM). The computational results indicate that the BEM has an advantage over the finite difference method (FDM) and the finite element method (FEM). Since only discretized equations on the boundary of solved domain need to be solved, the grid number on the boundary is much smaller and mesh generation is greatly simplified. Hence the execution CPU time is reduced drastically. In order to treat the corners on the boundary, the concept of multiple normal derivatives at a corner is proposed. The concept is used in both continuous and partially discontinuous linear elements to increase the accuracy and reduce the number of unknowns. It is shown that a nonuniform mesh scheme is useful for problems with some stronger singularities
Keywords :
boundary-elements methods; digital simulation; electric resistance; electronic engineering computing; BEM; VLSI layout; boundary element method; grid number; mesh generation; multiple normal derivatives; nonuniform mesh scheme; parasitic parameters extraction; resistor network; two-dimensional resistance simulator; Boundary element methods; Computational modeling; Finite difference methods; Finite element methods; Geometry; Integral equations; Laplace equations; Mesh generation; Shape; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on