DocumentCode
837436
Title
High-temperature defect structure of Cd- and Te-rich CdTe
Author
Grill, R. ; Franc, J. ; Höschl, P. ; Turkevych, I. ; Belas, E. ; Moravec, P. ; Fiederle, M. ; Benz, K.W.
Author_Institution
Inst. of Phys., Charles Univ., Prague, Czech Republic
Volume
49
Issue
3
fYear
2002
fDate
6/1/2002 12:00:00 AM
Firstpage
1270
Lastpage
1274
Abstract
Quasi-chemical formalism is used to evaluate high temperature (600°C-1000°C) in situ conductivity and Hall effect measurements and simultaneously tellurium atom fraction in CdTe along the three-phase curve. We show that the electric properties can be described only by two native defects-cadmium interstitial as the divalent donor and cadmium vacancy as the divalent acceptor. Close to Te saturation, another native defect must be involved in the model to allow the deviation from the stoichiometry irrespective of the low density of electrically charged defects. Deep divalent donor TeCd having both levels near or below the midgap best describes all the high-temperature experimental data.
Keywords
Boltzmann equation; Hall effect; II-VI semiconductors; cadmium compounds; charge compensation; defect states; interstitials; stoichiometry; vacancies (crystal); 600 to 1000 C; Boltzmann equation; CdTe; Hall effect; cadmium interstitial; cadmium vacancy; defect formation energy; divalent acceptor; divalent donor; electric neutrality condition; electrically charged defects; galvanomagnetic properties; high-temperature defect structure; in situ conductivity; ionization energy; native defects; quasichemical formalism; stoichiometry; tellurium atom fraction; three-phase curve; Atomic measurements; Cadmium; Conductivity measurement; Crystalline materials; Crystals; Hall effect; Impurities; Mechanical factors; Tellurium; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2002.1039650
Filename
1039650
Link To Document