DocumentCode :
837449
Title :
The BaBar RadFET monitoring board
Author :
Camanzi, Barbara ; Crawley, H. Bert ; Holmes-Siedle, Andrew ; McKay, Roy L. ; McKemey, Adrian ; Meyer, W.T. ; Rosenberg, Eli I. ; Stelzer, Joerg ; Tinslay, Jane
Author_Institution :
Dept. of Electron. Eng., Brunel Univ., Uxbridge, UK
Volume :
49
Issue :
3
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
1275
Lastpage :
1280
Abstract :
The monitoring board to interface the RadFET integrated radiation dosimeters to the BaBar detector control system is described. RadFET sensors are specially designed p-channel MOSFET transistors that measure lifetime integrated radiation exposure by measuring the source-drain voltage at a fixed current. As the device is irradiated, positive space charge is trapped in the oxide layer, which results in an increase in the source-drain voltage. Communication with the BaBar detector control system proceeds via a CANbus interface using a Motorola microcontroller on the monitoring board and the BaBar standard monitoring tools on the BaBar side. The RadFET monitoring board (RMB) can read up to 32 sensors. A manual control allows for adjustment of an offset voltage to increase the maximum readable value as the device receives more exposure while retaining the original circuit precision. Results from monitoring during the first years of BaBar running are presented.
Keywords :
MOSFET circuits; controller area networks; dosimeters; integrated circuits; microcontrollers; nuclear electronics; physical instrumentation control; position sensitive particle detectors; radiation monitoring; readout electronics; system buses; BaBar RadFET monitoring board; BaBar detector control system; CANbus interface; Motorola microcontroller; dosimetry; integrated radiation dosimeters; lifetime integrated radiation exposur; manual control; maximum readable value; p-channel MOSFET transistors; positive space charge; radiation detector circuits; source-drain voltage; Communication standards; Communication system control; Control systems; Current measurement; MOSFET circuits; Microcontrollers; Radiation detectors; Radiation monitoring; Space charge; Voltage measurement;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.1039651
Filename :
1039651
Link To Document :
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