Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

Author

Manghisoni, M. ; Ratti, L. ; Re, V. ; Speziali, V.

Author_Institution

Dipt. di Ingegneria, Universita di Bergamo, Dalmine, Italy

Volume

49

Issue

3

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

1281

Lastpage

1286

Abstract

High-density high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room-temperature X- and γ-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high-speed analog signal processing. This instrument extends the noise-measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors.

Keywords

CMOS analogue integrated circuits; X-ray detection; analogue processing circuits; gamma-ray detection; integrated circuit measurement; preamplifiers; readout electronics; white noise; γ-ray imaging detectors; 1/f noise corner frequency; CMOS transistors; X-ray imaging detectors; detector preamplifiers; high-speed analog signal processing; noise measurements; readout integrated circuits; shorter channel devices; white noise component; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; Detectors; High speed integrated circuits; Instruments; Integrated circuit noise; Integrated circuit technology; Noise measurement; Preamplifiers;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.1039652

Filename

1039652