• DocumentCode
    837532
  • Title

    Sixth European Conference on Radiation and its Effects on Components and Systems (RADECS)

  • Author

    Velazco, Raoul ; Ecoffet, R.

  • Author_Institution
    TIMA
  • Volume
    49
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Keywords
    ion beam effects; nuclear electronics; radiation hardening (electronics); design hardening; dose-rate effects; hardness assurance; ionizing radiation; irradiation effects; irradiation-induced defects; photonics; single event effects; technology hardening;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.1039658
  • Filename
    1039658