Title :
Sixth European Conference on Radiation and its Effects on Components and Systems (RADECS)
Author :
Velazco, Raoul ; Ecoffet, R.
Author_Institution :
TIMA
fDate :
6/1/2002 12:00:00 AM
Keywords :
ion beam effects; nuclear electronics; radiation hardening (electronics); design hardening; dose-rate effects; hardness assurance; ionizing radiation; irradiation effects; irradiation-induced defects; photonics; single event effects; technology hardening;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.1039658
