• DocumentCode
    837571
  • Title

    Transients in Testing Transformers Due to the Generation of Switching Impulses

  • Author

    Kind, D. ; Wehinger, H.

  • Author_Institution
    Physikalisch-Technische Bundesanstalt
  • Issue
    2
  • fYear
    1978
  • fDate
    3/1/1978 12:00:00 AM
  • Firstpage
    563
  • Lastpage
    568
  • Abstract
    Testing transformers are used to advantage for the generation of switching impulses. Nevertheless, transients and overvoltages do occur, particularly in cascaded transformers with several stages. Different types of transients were investigated, namely the saturation of the iron core, the voltage distribution in cascades and the oscillations inside the HV winding. In addition to the measurements, digital computations with special equivalent circuits were carried out. The agreement between the results of measurements and calculations enabled suitable methods for the prevention of overvoltages to be devised.
  • Keywords
    Capacitance; Circuit testing; Equivalent circuits; Impulse testing; Power system transients; Surges; Switches; Switching circuits; Thyristors; Transformer cores;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9510
  • Type

    jour

  • DOI
    10.1109/TPAS.1978.354519
  • Filename
    4181464