DocumentCode :
837571
Title :
Transients in Testing Transformers Due to the Generation of Switching Impulses
Author :
Kind, D. ; Wehinger, H.
Author_Institution :
Physikalisch-Technische Bundesanstalt
Issue :
2
fYear :
1978
fDate :
3/1/1978 12:00:00 AM
Firstpage :
563
Lastpage :
568
Abstract :
Testing transformers are used to advantage for the generation of switching impulses. Nevertheless, transients and overvoltages do occur, particularly in cascaded transformers with several stages. Different types of transients were investigated, namely the saturation of the iron core, the voltage distribution in cascades and the oscillations inside the HV winding. In addition to the measurements, digital computations with special equivalent circuits were carried out. The agreement between the results of measurements and calculations enabled suitable methods for the prevention of overvoltages to be devised.
Keywords :
Capacitance; Circuit testing; Equivalent circuits; Impulse testing; Power system transients; Surges; Switches; Switching circuits; Thyristors; Transformer cores;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1978.354519
Filename :
4181464
Link To Document :
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