Title :
A Novel
Schottky Diode-Type Hydrogen Sensor
Author :
Hung, Ching-Wen ; Lin, Han-Lien ; Chen, Huey-Ing ; Tsai, Yan-Ying ; Lai, Po-Hsien ; Fu, Ssu-I ; Liu, Wen-Chau
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
On the basis of a Pt/In0.52Al0.48As metal-semiconductor structure, a novel hydrogen sensor is fabricated and demonstrated. The studied Pt/In0.52Al0.48As Schottky diode-type hydrogen sensor exhibits significant sensing performance including high relative sensitivity ratio of about 2600% (under the 1% H2/air gas and VR=-0.5 V at 30 degC), large current variation of 310 muA (under the 1% H2/air gas and VR=-5 V at 200 degC), widespread reverse-voltage regime (0~-5 V), stable hydrogen-sensing current-voltage (I-V) curves, and fast transient response time of 1.5 s. The calculated Schottky barrier-height change and series-resistance variation, from the thermionic-emission model and Norde method, are 87.0 meV and 288 Omega, respectively (under the 1% H2/air gas at 30 degC). The hydrogen concentrations and operating temperatures tested in this letter are in the range of 15 ppm-1% H2/air and 30 degC-250 degC, respectively. Based on the excellent integration compatibility with InP-based electronic devices, the studied device provides the potentiality in high-performance sensor-array applications
Keywords :
III-V semiconductors; Schottky barriers; Schottky diodes; aluminium compounds; gas sensors; hydrogen; indium compounds; platinum; thermionic emission; -0.5 V; 1.5 s; 30 to 250 C; 310 muA; 87 meV; Norde method; Pt-In0.52Al0.48As; Schottky barrier-height change; Schottky diode-type hydrogen sensor; hydrogen concentrations; metal-semiconductor structure; series-resistance variation; thermionic-emission model; Gas detectors; Hydrogen; Indium phosphide; Schottky diodes; Semiconductor diodes; Temperature distribution; Temperature sensors; Testing; Time factors; Transient response; $hbox{In}_{0.52}hbox{Al}_{0.48}hbox{As}$; Pt; Schottky diode; relative sensitivity ratio; reverse voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2006.886313