DocumentCode
837883
Title
Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser
Author
Buchner, S. ; McMorrow, D. ; Sternberg, A. ; Massengill, L. ; Pease, R.L. ; Maher, M.
Author_Institution
SFA Inc., Largo, MD, USA
Volume
49
Issue
3
fYear
2002
fDate
6/1/2002 12:00:00 AM
Firstpage
1502
Lastpage
1508
Abstract
The characteristics of single-event transients (SETs) generated in an LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
Keywords
comparators (circuits); measurement by laser beam; LM119 voltage comparator; circuit simulator programs; pulsed laser; single-event transients; Bipolar transistor circuits; Circuit simulation; Circuit testing; Ion beams; Laser modes; Life estimation; Optical pulse generation; Optical pulses; Pulse circuits; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2002.1039691
Filename
1039691
Link To Document