Title :
Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser
Author :
Buchner, S. ; McMorrow, D. ; Sternberg, A. ; Massengill, L. ; Pease, R.L. ; Maher, M.
Author_Institution :
SFA Inc., Largo, MD, USA
fDate :
6/1/2002 12:00:00 AM
Abstract :
The characteristics of single-event transients (SETs) generated in an LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
Keywords :
comparators (circuits); measurement by laser beam; LM119 voltage comparator; circuit simulator programs; pulsed laser; single-event transients; Bipolar transistor circuits; Circuit simulation; Circuit testing; Ion beams; Laser modes; Life estimation; Optical pulse generation; Optical pulses; Pulse circuits; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.1039691
