• DocumentCode
    837885
  • Title

    The Role of Charged Particle Activation for Materials Analysis

  • Author

    Debrun, J.L.

  • Author_Institution
    Groupe d´´Application des Réactions Nucléaires Ã\xa0 l´´Analyse Chimique - CNRS - Service du Cyclotron 3A, rue de la Fédrollerie 45045 Orleans Cédex France
  • Volume
    26
  • Issue
    2
  • fYear
    1979
  • fDate
    4/1/1979 12:00:00 AM
  • Firstpage
    2229
  • Lastpage
    2235
  • Abstract
    In this discussion, we first try to define the cases where analysis by irradiation with charged particles requires the use of relatively high energy beams, e.g from a cyclotron or from a Tandem Van de Graaff. It seems that the most important method using high energy charged particles, is activation analysis. We describe the important features of this method, we compare them with those of other methods, and we try to show the important role it plays in two important fields : -The analysis of traces -The elaboration of reference materials.
  • Keywords
    Activation analysis; Biological materials; Cyclotrons; Impurities; Lattices; Mechanical factors; Particle beams; Radioactive materials; Semiconductor materials; Surface contamination;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1979.4329845
  • Filename
    4329845