DocumentCode :
837885
Title :
The Role of Charged Particle Activation for Materials Analysis
Author :
Debrun, J.L.
Author_Institution :
Groupe d´´Application des Réactions Nucléaires Ã\xa0 l´´Analyse Chimique - CNRS - Service du Cyclotron 3A, rue de la Fédrollerie 45045 Orleans Cédex France
Volume :
26
Issue :
2
fYear :
1979
fDate :
4/1/1979 12:00:00 AM
Firstpage :
2229
Lastpage :
2235
Abstract :
In this discussion, we first try to define the cases where analysis by irradiation with charged particles requires the use of relatively high energy beams, e.g from a cyclotron or from a Tandem Van de Graaff. It seems that the most important method using high energy charged particles, is activation analysis. We describe the important features of this method, we compare them with those of other methods, and we try to show the important role it plays in two important fields : -The analysis of traces -The elaboration of reference materials.
Keywords :
Activation analysis; Biological materials; Cyclotrons; Impurities; Lattices; Mechanical factors; Particle beams; Radioactive materials; Semiconductor materials; Surface contamination;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1979.4329845
Filename :
4329845
Link To Document :
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