A custom hybrid GaAs driver and sensor device for a high-speed test system

Author

Tsai, Sheng-Jen ; Hechtman, Charles D.

Author_Institution

AT&T Bell Labs., Princeton, NJ, USA

Volume

36

Issue

2

fYear

1989

fDate

5/1/1989 12:00:00 AM

Firstpage

175

Lastpage

184

Abstract

A customized hybrid GaAs device has been designed and prototyped that can operate from DC to 100 MHz and above, interface directly with ECL (emitter-coupled logic), TT (transistor-transistor logic), and CMOS components, and handle both the in-circuit and device testing environments. The circuits for both the driver and sensor are delineated, and some of the design issues are discussed. The prototyping of the design into a hybrid IC is explained and experimental performance results are presented.<>

Keywords

III-V semiconductors; application specific integrated circuits; automatic test equipment; driver circuits; electric sensing devices; gallium arsenide; hybrid integrated circuits; integrated circuit testing; 0 to 100 MHz; CMOS components; device testing; emitter-coupled logic; high-speed test system; hybrid GaAs driver; in-circuit testing; sensor device; transistor-transistor logic; Automatic test equipment; Automatic testing; Circuit testing; Costs; Driver circuits; Environmental economics; Gallium arsenide; Prototypes; Sensor systems; System testing;

fLanguage

English

Journal_Title

Industrial Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0278-0046

Type

jour

DOI

10.1109/41.19066

Filename

19066