Title :
In-circuit test fixture [PCB testing]
Author :
Hechtman, Charles D.
Author_Institution :
AT&T Bell Labs., Princeton, NJ, USA
fDate :
5/1/1989 12:00:00 AM
Abstract :
Deficiencies in the conventional in-circuit fixture are presented. A novel fixture is described, and quantitative comparisons are presented. Crosstalk is decreased by 60 dB, and transmission-line matching is possible
Keywords :
crosstalk; printed circuit testing; transmission line theory; crosstalk; in-circuit test; printed circuit testing; transmission-line matching; Circuit testing; Couplings; Crosstalk; Electronic equipment testing; Fixtures; Frequency; Pins; Transmission lines; Wire; Wounds;
Journal_Title :
Industrial Electronics, IEEE Transactions on
