DocumentCode :
838946
Title :
Incoming test strategy based upon in-process failure and repair costs
Author :
Ballew, W. David ; Streb, Lauren M.
Author_Institution :
AT&T, Oklahoma City, OK, USA
Volume :
36
Issue :
2
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
203
Lastpage :
210
Abstract :
An economic model is developed that challenges traditional statistical quality control methods in the factory. Incoming inspection levels can be determined as a function of both the PPM failure rates and the lot-to-lot stability. Since current incoming failure rates have fallen two orders of magnitude to below 100 PPM, the model can be used to re-evaluate conventional test strategies in high-volume manufacturing operations. Process variability as measured by statistical process control methods can now be monitored as lot stability and incoming inspection levels are adjusted accordingly.<>
Keywords :
economics; inspection; statistical process control; economic model; in-process failure; inspection; repair costs; statistical process control; test strategy; Circuit testing; Cities and towns; Communication industry; Computer integrated manufacturing; Continuous improvement; Costs; Manufacturing industries; Monitoring; Production facilities; Switches;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/41.19070
Filename :
19070
Link To Document :
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