DocumentCode :
838989
Title :
A universal test and maintenance controller for modules and boards
Author :
Lien, Jung-Cheun ; Breuer, Melvin A.
Author_Institution :
Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA
Volume :
36
Issue :
2
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
231
Lastpage :
240
Abstract :
The design of a versatile module test and maintenance controller (MMC) is presented. Driven by structures test programs, an MMC is able to test every chip in a module or PCB via a test bus. More than one test bus can be controlled by an MMC, and can support several bus architectures and many modes of testing. The differences between MMCs on different modules are the test programs that they execute, the number of test buses they control, and the expansion units they use. A simple yet novel circuit, called a test channel, is used in an MMC. The MMC processor can control a test channel by reading/writing its internal registers. Once initialized by the MMC processor, a test channel can carry out most of the testing of a chip. Thus the processor need not deal with detailed test-bus control sequences since they are generated by the test channel. This strategy greatly simplifies the development of test programs. The proposed MMC can be implemented as a single-chip ASIC (application-specific integrated circuit) or by off-the-shelf components. Some of its self-test features are presented.<>
Keywords :
application specific integrated circuits; controllers; maintenance engineering; printed circuit testing; PCB testing; application-specific integrated circuit; bus architectures; chip testing; maintenance controller; self-test features; single-chip ASIC; structures test programs; test channel; test controllers; Application specific integrated circuits; Circuit testing; Control systems; Design for testability; Process control; Proposals; Protocols; Registers; System testing; Writing;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/41.19074
Filename :
19074
Link To Document :
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