Title :
Design of self-diagnostic boards by signature analysis
Author :
Karpovsky, Mark G. ; Nagvajara, Prawat
Author_Institution :
Dept. of Electr., Comput & Syst. Eng., Boston Univ., MA, USA
fDate :
5/1/1989 12:00:00 AM
Abstract :
The authors present a single-faulty-chip diagnostic technique which requires only two reference signatures for any number of chips on the original board. With this technique, it is possible to reduce substantially the hardware overhead compared to the diagnostic technique based on separate testing of each chip on the board. The technique can be also used for identification of faulty printed boards in a system or for identification of faulty processors in a multiprocessor system.<>
Keywords :
automatic testing; logic testing; printed circuit design; printed circuit testing; faulty processors; multiprocessor system; printed boards; self-diagnostic boards; signature analysis; single-faulty-chip diagnostic technique; Automatic testing; Design for testability; Fault diagnosis; Hardware; Manufacturing; Multiprocessing systems; System buses; System testing; Test pattern generators; Very large scale integration;
Journal_Title :
Industrial Electronics, IEEE Transactions on
