Title :
Field programmable gate arrays in space
Author_Institution :
European Space Research and Technology Centre, European Space Agency
Abstract :
The use of field programmable gate arrays (FPGAs) in satellite and other spacecraft is on the rise. They are increasingly competitive when compared to traditional application-specific integrated circuits (ASICs). However, exposure to space radiation produces the same physical effects on both FPGAs and ASICs. How these radiation effects can translate to circuit malfunctions and how these problems can be prevented or mitigated is a complex, multifaceted issue that depends on the specific technology and the device´s internal architecture. First and foremost, designers should implement a reliable ASIC/FPGA development methodology for the definition, design, verification, physical implementation and validation phases of any ASIC/FPGA to be flown as part of the spacecraft platform or critical payload. This should be contractually enforced. The European Space Agency (ESA) will continue to make available its own internal standard or any other equivalent methodology proposed by the contractor. As soon as the new ECSS standard on this subject is available, ESA will start using it as an applicable document in all projects where ASICs or FPGAs are to be developed.
Keywords :
application specific integrated circuits; circuit reliability; field programmable gate arrays; radiation effects; radiation hardening (electronics); ASIC; European Space Agency; FPGA; IC design; IC internal architecture; IC reliability; IC verification; application-specific integrated circuits; circuit malfunctions; critical payload; field programmable gate arrays; physical effects; satellite; space radiation; spacecraft; Aerospace electronics; Application specific integrated circuits; Design methodology; Electron traps; Field programmable gate arrays; Integrated circuit technology; Leakage current; Protons; Radiation effects; Space technology;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2003.1251482