Title :
An I/O Efficient Model Checking Algorithm for Large-Scale Systems
Author :
Lijun Wu ; Huijia Huang ; Kaile Su ; Shaowei Cai ; Xiaosong Zhang
Author_Institution :
Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
Model checking is a powerful approach for the formal verification of hardware and software systems. However, this approach suffers from the state space explosion problem, which limits its application to large-scale systems due to space shortage. To overcome this drawback, one of the most effective solutions is to use external memory algorithms. In this paper, we propose an I/O efficient model checking algorithm for large-scale systems. To lower I/O complexity and improve time efficiency, we combine three new techniques: 1) a linear hash-sorting technique; 2) a cached duplicate detection technique; and 3) a dynamic path management technique. We show that the new algorithm has a lower I/O complexity than state-of-the-art I/O efficient model checking algorithms, including detect accepting cycle, maximal accepting predecessors, and iterative-deepening depth-first search. In addition, the experiments show that our algorithm obviously outperforms these three algorithms on the selected representative benchmarks in terms of performance.
Keywords :
cache storage; formal verification; large scale integration; I/O complexity; I/O efficient model checking algorithm; cached duplicate detection technique; detect accepting cycle; dynamic path management technique; external memory algorithm; formal verification; hardware system; iterative-deepening depth-first search; large-scale system; linear hash-sorting technique; maximal accepting predecessor; software system; state space explosion problem; Algorithm design and analysis; Automata; Complexity theory; Heuristic algorithms; Large-scale systems; Memory management; Model checking; Duplicate detection; dynamic search path management; linear hash-sorting; model checking; state space explosion; state space explosion.;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2330061