Title :
Operation tests for SN transition superconducting fault current limiter in the power system simulator
Author :
Torii, S. ; Kameda, H. ; Kumano, T. ; Sakaki, H. ; Kubota, H. ; Yasuda, K.
Author_Institution :
Central Res. Inst. of Electr. Power Ind., Japan
fDate :
6/1/2005 12:00:00 AM
Abstract :
One of important problems to be solved in Japanese trunk transmission systems is the reduction of short-circuit capacity. As one solution, double buses are split into two buses in some substations. In recent years, dispersed generators have been introduced in lower voltage classes due to the deregulation of the electricity. A fault current exceeding the capacity flows during a short-circuit fault by the connection of dispersed generators. One of the key technologies for solving the above problem is the fault current limiter. We are presently conducting research on the effect of the introduction of fault current limiters into a power system. In this paper, we describe the results of operation tests of the SN transition superconducting fault current limiter (SCFCL) using 3 phases of SCFCL modules against various kinds of system faults or inrush current in the power system simulator installed at Central Research Institute of Electric Power Industry (CRIEPI).
Keywords :
fault current limiters; power system simulation; power transmission faults; power transmission lines; superconducting thin films; Central Research Institute of Electric Power Industry; Japanese trunk transmission systems; SCFCL modules; SN transition; YBCO thin film; dispersed generators; electricity deregulation; inrush current; power system simulator; short-circuit capacity reduction; short-circuit fault; superconducting fault current limiter; system faults; Distributed power generation; Electricity supply industry deregulation; Fault current limiters; Power generation; Power system faults; Power system simulation; Substations; System testing; Tin; Voltage; Dispersed generator; YBCO thin film; power system simulator; superconducting fault current limiter;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849474