DocumentCode
839368
Title
Injection-Locked Clocking: A Low-Power Clock Distribution Scheme for High-Performance Microprocessors
Author
Zhang, Lin ; Carpenter, Aaron ; Ciftcioglu, Berkehan ; Garg, Alok ; Huang, Michael ; Wu, Hui
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY
Volume
16
Issue
9
fYear
2008
Firstpage
1251
Lastpage
1256
Abstract
We propose injection-locked clocking (ILC) to combat deteriorating clock skew and jitter, and reduce power consumption in high-performance microprocessors. In the new clocking scheme, injection-locked oscillators are used as local clock receivers. Compared to conventional clocking with buffered trees or grids, ILC can achieve better power efficiency, lower jitter, and much simpler skew compensation thanks to its built-in deskewing capability. Unlike other alternatives, ILC is fully compatible with conventional clock distribution networks. In this paper, a quantitative study based on circuit and microarchitectural-level simulations is performed. Alpha21264 is used as the baseline processor, and is scaled to 0.13 m and 3 GHz. Simulations show 20- and 23-ps jitter reduction, 10.1% and 17% power savings in two ILC configurations. A test chip distributing 5-GHz clock is implemented in a standard 0.18- m CMOS technology and achieved excellent jitter performance and a deskew range up to 80 ps.
Keywords
CMOS integrated circuits; circuit simulation; clocks; injection locked oscillators; jitter; microprocessor chips; power consumption; Alpha21264; CMOS; baseline processor; built-in deskewing capability; circuit simulation; deteriorating clock skew; frequency 3 GHz; high-performance microprocessors; injection-locked clocking; injection-locked oscillators; jitter reduction; local clock receivers; low-power clock distribution scheme; microarchitectural-level simulations; power consumption reduction; size 0.18 mum; skew compensation; CMOS technology; Circuit simulation; Clocks; Energy consumption; Integrated circuit interconnections; Jitter; Microprocessors; Parasitic capacitance; Phase locked loops; Voltage;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2008.2000976
Filename
4603038
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