Distributed network platform for automatic optical inspection

Author

Moreira, L.F.E. ; Silvino, J.L. ; de Melo, J.C.D. ; Coelho, C.N., Jr.

Author_Institution

Electr. Eng. R&D Center, Fed. Univ. of Minas Gerais, Belo Horizonte-MG, Brazil

Volume

39

Issue

24

fYear

2003

Firstpage

1721

Lastpage

1723

Abstract

Network bandwidth is a bottleneck for multipoint industrial automatic optical inspection. To avoid this constraint, a platform that integrates image acquisition and processing power to allow local processing is proposed. The reduction of network bandwidth requirements is discussed. The performance and feasibility is briefly discussed through preliminary experimental results.

Keywords

CMOS image sensors; automatic optical inspection; computer vision; embedded systems; field programmable gate arrays; intelligent sensors; reconfigurable architectures; CMOS image sensors; FPGA; RAMDAC; automatic optical inspection; configuration controller; costs per inspection point; distributed network platform; embedded execution; fully distributed inspection; image acquisition; image processing power; inspection algorithms; intelligent camera; interface logic; local processing; machine vision; multipoint industrial inspection; network bandwidth; quality control; reconfiguration capabilities; software interface;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:20031120

Filename

1251539