DocumentCode :
839730
Title :
IP Watermarking Using Incremental Technology Mapping at Logic Synthesis Level
Author :
Cui, Aijiao ; Chang, Chip H. ; Tahar, Sofiene
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
27
Issue :
9
fYear :
2008
Firstpage :
1565
Lastpage :
1570
Abstract :
This paper proposes an adaptive watermarking technique by modulating some closed cones in an originally optimized logic network (master design) for technology mapping. The headroom of each disjoint closed cone is evaluated based on its slack and slack sustainability. The notion of slack sustainability in conjunction with an embedding threshold enables closed cones in the critical path to be qualified as watermark hosts if their slacks can be better preserved upon remapping. The watermark is embedded by remapping only qualified disjoint closed cones randomly selected and templates constrained by the signature. This parametric formulation provides a means to capitalize on the headroom of a design to increase the signature length or strengthen the watermark resilience. With the master design, the watermarked design can be authenticated as in nonoblivious media watermarking. Experimental results show that the design can be efficiently marked by our method with low overhead.
Keywords :
industrial property; watermarking; IP watermarking; adaptive watermarking technique; disjoint closed cone; incremental technology mapping; logic synthesis level; nonoblivious media watermarking; optimized logic network; slack sustainability; technology mapping; watermark resilience; Bandwidth; Design optimization; Integrated circuit synthesis; Integrated circuit technology; Intellectual property; Logic design; Network synthesis; Protection; Very large scale integration; Watermarking; Digital watermarking; incremental technology mapping; intellectual property (IP) protection (IPP); logic synthesis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.927732
Filename :
4603076
Link To Document :
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