Title :
Improving Automatic Detection of Defects in Castings by Applying Wavelet Technique
Author :
Li, Xiaoli ; Tso, S.K. ; Guan, Xin-Ping ; Huang, Qian
Author_Institution :
Center for Networking Control & Bioinformatics, Yanshan Univ., Qinhuangdao
Abstract :
X-ray-based inspection systems are a well-accepted technique for identification and evaluation of internal defects in castings, such as cracks, porosities, and foreign inclusions. In this paper, some images showing typical internal defects in the castings derived from an X-ray inspection system are processed by some traditional methods and wavelet technique in order to facilitate automatic detection of these internal defects. An X-ray inspection system used to detect the internal defects of castings and the typical internal casting defects is first addressed. Second, the second-order derivative and morphology operations, the row-by-row adaptive thresholding, and the two-dimensional (2-D) wavelet transform methods are described as potentially useful processing techniques. The first method can effectively detect air-holes and foreign-inclusion defects, and the second one can be suitable for detecting shrinkage cavities. Wavelet techniques, however, can effectively detect the three typical defects with a selected wavelet base and multiresolution levels. Results indicate that 2-D wavelet transform is a powerful method to analyze images derived from X-ray inspection for automatically detecting typical internal defects in the casting
Keywords :
X-ray imaging; casting; flaw detection; inspection; radiography; wavelet transforms; X-ray-based inspection systems; air-holes detection; automatic defect detection; castings; cracks; foreign inclusion defects; image processing; internal defects; morphology operations; porosities; row-by-row adaptive thresholding; shrinkage cavities detection; two-dimensional wavelet transform methods; wavelet technique; Casting; Image analysis; Inspection; Morphology; Two dimensional displays; Wavelet analysis; Wavelet transforms; X-ray detection; X-ray detectors; X-ray imaging; Castings; X-ray inspection; defects; image processing; wavelet transform;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2006.885448