DocumentCode :
839815
Title :
Challenges Related to Reliability in Nano Electronics
Author :
Way Kuo
Volume :
55
Issue :
4
fYear :
2006
Firstpage :
569
Lastpage :
570
Abstract :
Abs
Keywords :
design; fault tolerance; military systems; nanobiotechnology; nanoelectronics; reviews; MEMS; biotechnology; design; failure mechanism; fault tolerance; military system; nanoelectronics; nanofabrication; nanoproducts; nanotechnology; reliability; Capacitors; Computer aided manufacturing; Fabrication; Failure analysis; Integrated circuit reliability; Integrated circuit technology; Life estimation; Manufacturing industries; Microprocessors; Virtual manufacturing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2006.884585
Filename :
4016402
Link To Document :
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