Title :
Characterization of interface roughness of rippled sand off Fort Walton Beach, Florida
Author :
Briggs, Kevin B. ; Tang, Dajun ; Williams, Kevin L.
Author_Institution :
Seafloor Sci. Branch, Naval Res. Labora, Stennis, MS, USA
fDate :
7/1/2002 12:00:00 AM
Abstract :
As part of the environmental characterization to model acoustic bottom scattering during the high-frequency sediment acoustics experiment (SAX99), fine-scale sediment roughness of a medium sand was successfully measured within a 600 × 600-m area by two methods: stereo photography and a technique using a conductivity system. Areal coverage of the two methods, representing approximately 0.16 m2 of the sea floor, was comparable, resulting in the depiction and quantification of half-meter wavelength sand ripples. Photogrammetric results were restricted to profiles digitized at 1-mm intervals; sediment conductivity results generated gridded micro-bathymetric measurements with 1- to 2-cm node spacing. Roughness power spectra give similar results in the low-spatial-frequency domains where the spectra estimated from both approaches overlap. However, spectra derived from higher resolution photogrammetric results appear to exhibit a multiple-power-law fit. Roughness measurements also indicate that spectrum changes as a function of time. Application of statistical confidence bounds on the power spectra indicates that roughness measurements separated by only 1-2 m may be spatially nonstationary.
Keywords :
acoustic wave scattering; bathymetry; electrical conductivity; interface roughness; photogrammetry; sand; seafloor phenomena; sediments; underwater sound; Florida; Fort Walton Beach; SAX99 experiment; acoustic bottom scattering; electrical conductivity; environmental characteristics; high-frequency sediment acoustics; interface roughness; micro-bathymetric measurement; power spectra; rippled sand; sea floor; stereo photogrammetry; Acoustic measurements; Acoustic scattering; Area measurement; Conductivity measurement; Mesh generation; Photography; Sea floor; Sea measurements; Sediments; Wavelength measurement;
Journal_Title :
Oceanic Engineering, IEEE Journal of
DOI :
10.1109/JOE.2002.1040934