DocumentCode :
839950
Title :
Investigation of potential benefits of MOSFETs hard-switching and soft-switching converters at cryogenic temperature
Author :
Li, Hui ; Liu, Danwei ; Luongo, Cesar A.
Author_Institution :
Dept. of Electr. Eng., Florida State Univ., Tallahassee, FL, USA
Volume :
15
Issue :
2
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
2376
Lastpage :
2380
Abstract :
This paper presents an investigation of potential advantages of MOSFETs hard-switching and soft-switching converter at liquid nitrogen temperature (LNT). Circuits are proposed, analyzed and built to demonstrate the different switching performance at room temperature and reduced temperature. The experimental results showed both hard-switching and soft-switching operation of MOSFETs in a boost converter is improved at 77 K. The gate drive circuit needs to be designed specially for MOSFETs to work well at liquid nitrogen temperature.
Keywords :
MOSFET circuits; cryogenic electronics; switching convertors; MOSFET; cryogenic temperature; gate drive circuit; hard-switching converters; liquid nitrogen temperature; soft-switching converters; Circuit analysis; Cryogenics; MOSFETs; Nitrogen; Snubbers; Superconducting coils; Switches; Switching circuits; Switching converters; Temperature; Cryogenic; MOSFETs; soft-switching;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2005.849672
Filename :
1440143
Link To Document :
بازگشت