DocumentCode
840644
Title
Critical role of primitive polynomials in an LFSR based testing technique
Author
Ahmad, Ayaz ; Nanda, N.K. ; Garg, Kumkum
Author_Institution
Dept. of Electron. & Comput. Eng., Roorkee Univ.
Volume
24
Issue
15
fYear
1988
fDate
7/21/1988 12:00:00 AM
Firstpage
953
Lastpage
955
Abstract
The results of a simulation of a linear feedback shift register (LFSR) based testing technique show that when the characteristic polynomials used in the test pattern generator, as well as in the signature analyser, are primitive and reciprocal to each other then maximum aliasing errors occur
Keywords
logic design; logic testing; polynomials; sequential circuits; shift registers; aliasing errors; characteristic polynomials; linear feedback shift register; primitive polynomials; sequential logic design; signature analyser; simulation; test pattern generator; testing technique;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
Filename
191658
Link To Document