Title :
Continuous deposition of thermally co-evaporated YBCO/CeO2/Ni coated conductors
Author :
Gauzzi, A. ; Bindi, M. ; Gianni, L. ; Ginocchio, S. ; Zannella, S. ; Baldini, A. ; Holzapfel, B. ; Bolzoni, F.
Author_Institution :
IMEM-CNR, Parma, Italy
fDate :
6/1/2005 12:00:00 AM
Abstract :
By using a simple single-pass reel-to-reel system, we demonstrate a simple and robust in-situ route for the continuous deposition of 1-2 m long Coated Conductors (CC) consisting of 1 μm thick superconducting YBa2Cu3O7 (YBCO) films deposited by thermal co-evaporation onto 100 nm thick CeO2 buffered cube textured Ni tapes. The buffer layer was deposited by either e-beam or thermal evaporation using respectively ceria or metallic cerium. The structural and morphological properties of the samples were investigated by X-ray ϑ-2ϑ Bragg-Brentano, and pole figure diffraction, Nomarsky optical microscopy and Scanning Electron Microscopy (SEM) analysis. The 123 composition was controlled during deposition by means of an atomic absorption system. The optimized buffer layer and YBCO layer are grown at 690°C in respectively forming gas and oxygen partial pressures of 5×10-5 mbar. These conditions ensure the growth of dense and crack-free layers with good biaxial texture, as indicated by FWHM´s values in the 5-7° range for both in- and out-of-plane orientations. Zero-resistance critical temperatures Tc=86-87 K with transition widths ΔTc<3 K are reproducibly obtained. End-to-end critical current densities Jc at 77 K and self-field typically are in the 1.5-2.5 MA/cm2 range, as measured by transport measurements. It is found that tape motion does not significantly affect these properties.
Keywords :
X-ray diffraction; barium compounds; buffer layers; cerium compounds; critical current density (superconductivity); electron beam deposition; high-temperature superconductors; nickel; optical microscopy; scanning electron microscopy; superconducting tapes; superconducting thin films; superconducting transition temperature; vacuum deposition; yttrium compounds; CeO2; CeO2 buffer layer; FWHM value; Ni; Ni coated conductor; Nomarsky optical microscopy; X-ray ϑ - 2ϑ Bragg-Brentano; YBCO coated conductor; YBa2Cu3O7; atomic absorption system; biaxial texture; continuous deposition; crack-free layer; e-beam evaporation; end-to-end critical current density; gas partial pressure; metallic cerium; morphological property; out-of-plane orientation; oxygen partial pressure; pole figure diffraction; scanning electron microscopy; single-pass reel-to-reel system; structural property; tape motion; thermal co-evaporation; transition width; transport measurement; zero-resistance critical temperature; Buffer layers; Conductive films; Current measurement; Density measurement; Optical buffering; Optical microscopy; Robustness; Scanning electron microscopy; Superconducting films; Yttrium barium copper oxide; YBCO; continuous deposition; thermal co-evaporation;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.847685