Fluorine analysis and microstructural evolution in coated YBCO conductor deposited by metal trifluoroacetate process

Author

Rane, Manisha V. ; Efstathiadis, Harry ; Bakhru, Hassa ; Rupich, Martin W. ; Li, X. ; Zhang, W. ; Kodenkandath, T. ; Haldar, Pradeep

Author_Institution

Albany Nanotech & Coll. of Nanoscale Sci. & Eng., NY, USA

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

2638

Lastpage

2641

Abstract

A solution based processes using metal trifluoroacetate (TFA) precursors is being developed for commercialization of Yttrium Barium Copper Oxide (YBCO) coated conductors. This nonvacuum technique uses inexpensive precursors and has the advantage of easy scalability, ease of composition control, eliminates carbonate formation during decomposition, and helps maintain film uniformity during heat treatment. However, fluorine remains incorporated in the YBCO film, depending on process conditions, and may result in a reduction of Jc. An appropriate heat treatment schedule ensures reduction of fluorine in the YBCO films as well as an improvement in microstructural properties. The aim of this work was to investigate the fluorine depth profile, density, and microstructural evolution of metal organic deposited (MOD) YBCO films with heat treatment using focused ion beam (FIB) microscopy, nuclear reaction analysis (NRA), and Rutherford backscattering spectroscopy (RBS). Multilayer structures studied consisted of 0.7 μm to 2.0 μm-thick YBCO layers deposited on a NiW alloy substrate buffered with CeO₂/YSZ/Y₂O₃.

Keywords

Rutherford backscattering; barium compounds; cerium compounds; critical current density (superconductivity); fluorine; focused ion beam technology; heat treatment; high-temperature superconductors; ion microscopy; multilayers; nickel alloys; organic compounds; substrates; superconducting tapes; yttrium compounds; 0.7 to 2.0 micron; Ce₂O-ZrO₂Y₂O₃-Y₂O₃; NiW; NiW alloy substrate; Rutherford backscattering spectroscopy; Y₂O₃; YBa₂Cu₃O₇; YSZ; carbonate formation; coated YBCO conductor; composition control; decomposition; film uniformity; fluorine analysis; fluorine depth profile; fluorine reduction; focused ion beam microscopy; heat treatment schedule; metal organic deposition; metal trifluoroacetate; microstructural evolution; microstructural property; multilayer structure; nuclear reaction analysis; vacuum technique; yttrium barium copper oxide coated conductor; Backscatter; Commercialization; Conductors; Heat treatment; Ion beams; Microscopy; Scalability; Scheduling; Temperature control; Yttrium barium copper oxide; Focused Ion Beam (FIB); Metal Organic Decomposition-Trifluoroacetate (MOD-TFA); Nuclear Reaction Analysis (NRA);

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.847688

Filename

1440208