• DocumentCode
    840830
  • Title

    “Ground-Referenced” Model for Three-Terminal Symmetric Double-Gate MOSFETs With Source/Drain Symmetry

  • Author

    Zhu, Guojun ; Guan Huei See ; Lin, Shihuan ; Zhou, Xing

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • Volume
    55
  • Issue
    9
  • fYear
    2008
  • Firstpage
    2526
  • Lastpage
    2530
  • Abstract
    This brief presents for the first time a ldquoground-referencedrdquo model to satisfy the Gummel symmetry test in three-terminal MOSFETs without body contact. Unlike four-terminal bulk MOSFETs, in which the bulk Fermi potential is set by the body voltage, a paradigm change is needed to model the respective electron and hole imrefs referenced to the ground rather than to model the imref-split referenced to the source. Together with the model consistency requirement for any reference voltages, the proposed formulations, as illustrated with undoped symmetric double-gate MOSFETs, provide a guide for formulating compact models with source/drain (S/D) symmetry, which can also be easily extended to model unintentional or intentional S/D asymmetry.
  • Keywords
    MOSFET; semiconductor device models; Gummel symmetry test; MOSFET; bulk Fermi potential; ground-referenced model; Boundary conditions; Charge carrier processes; Circuits; FinFETs; MOS devices; MOSFETs; Nanoscale devices; Smoothing methods; Testing; Voltage; Body contact; Gummel symmetry test (GST); compact model; double gate (DG); ground reference; imref; source/drain (S/D) symmetry/asymmetry; three-terminal MOSFET;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.928022
  • Filename
    4603187