Title :
“Ground-Referenced” Model for Three-Terminal Symmetric Double-Gate MOSFETs With Source/Drain Symmetry
Author :
Zhu, Guojun ; Guan Huei See ; Lin, Shihuan ; Zhou, Xing
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
This brief presents for the first time a ldquoground-referencedrdquo model to satisfy the Gummel symmetry test in three-terminal MOSFETs without body contact. Unlike four-terminal bulk MOSFETs, in which the bulk Fermi potential is set by the body voltage, a paradigm change is needed to model the respective electron and hole imrefs referenced to the ground rather than to model the imref-split referenced to the source. Together with the model consistency requirement for any reference voltages, the proposed formulations, as illustrated with undoped symmetric double-gate MOSFETs, provide a guide for formulating compact models with source/drain (S/D) symmetry, which can also be easily extended to model unintentional or intentional S/D asymmetry.
Keywords :
MOSFET; semiconductor device models; Gummel symmetry test; MOSFET; bulk Fermi potential; ground-referenced model; Boundary conditions; Charge carrier processes; Circuits; FinFETs; MOS devices; MOSFETs; Nanoscale devices; Smoothing methods; Testing; Voltage; Body contact; Gummel symmetry test (GST); compact model; double gate (DG); ground reference; imref; source/drain (S/D) symmetry/asymmetry; three-terminal MOSFET;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.928022