Title :
A Statistics-Based Approach to Binary Image Registration with Uncertainty Analysis
Author :
Simonson, Katherine M. ; Drescher, Steven M. ; Tanner, Franklin R.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM
Abstract :
A new technique is described for the registration of edge-detected images. While an extensive literature exists on the problem of image registration, few of the current approaches include a well-defined measure of the statistical confidence associated with the solution. Such a measure is essential for many autonomous applications, where registration solutions that are dubious (involving poorly focused images or terrain that is obscured by clouds) must be distinguished from those that are reliable (based on clear images of highly structured scenes). The technique developed herein utilizes straightforward edge pixel matching to determine the "best" among a class of candidate translations. A well-established statistical procedure, the McNemar test, is then applied to identify which other candidate solutions are not significantly worse than the best solution. This allows for the construction of confidence regions in the space of the registration parameters. The approach is validated through a simulation study and examples are provided of its application in numerous challenging scenarios. While the algorithm is limited to solving for two-dimensional translations, its use in validating solutions to higher-order (rigid body, affine) transformation problems is demonstrated
Keywords :
image matching; image registration; statistical analysis; McNemar test; binary image registration; computer vision; edge detection; edge pixel matching; feature detection; image processing; nonparametric statistics; probabilistic reasoning; statistics-based approach; uncertainty analysis; Application software; Clouds; Computer vision; Focusing; Image analysis; Image edge detection; Image registration; Layout; Testing; Uncertainty; "fuzzy; Registration; edge and feature detection; image processing and computer vision.; nonparametric statistics; uncertainty; ¿ and probabilistic reasoning; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2007.250603