Title :
Relative intensity noise in semiconductor optical amplifiers
Author :
Rideout, William ; Eichen, Elliot ; Schlafer, John ; LaCourse, Joanne ; Meland, Ed
Author_Institution :
GTE Lab. Inc., Waltham, MA, USA
Abstract :
The spontaneous noise spectrum of high-gain semiconductor optical amplifiers is normally assumed to be dominated by spontaneous-spontaneous and signal-spontaneous beat noise, which is white over the frequency range important to fiber-optic systems. Recent measurements have shown that a strong resonance peak in the spontaneous noise spectrum appears well below the threshold current, indicating the existence of relative intensity noise. This noise term has important implications for system design, and its effect on several transmission systems is described. Relative intensity noise in semiconductor optical amplifiers is compared to the similar relative intensity noise found in semiconductor lasers.<>
Keywords :
electron device noise; optical communication equipment; semiconductor junction lasers; fiber-optic systems; frequency range; high-gain semiconductor optical amplifiers; relative intensity noise; semiconductor lasers; signal-spontaneous beat noise; spontaneous noise spectrum; spontaneous-spontaneous beat noise; strong resonance peak; system design; threshold current; transmission systems; Current measurement; Frequency; Laser noise; Noise measurement; Optical noise; Resonance; Semiconductor device noise; Semiconductor optical amplifiers; Threshold current; White noise;
Journal_Title :
Photonics Technology Letters, IEEE
