Title :
Study of enhanced bit error rate and Bit skipping due to parasitic coupling in vertical-cavity surface-emitting laser arrays
Author_Institution :
Science Applications International Corporation
Keywords :
Bit error rate; Charge carrier density; Jitter; Mutual coupling; Optical arrays; Optical coupling; Optical signal processing; Surface emitting lasers; Time factors; Vertical cavity surface emitting lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2003.821527
