Optimum simple ramp-tests for the Weibull distribution and type-I censoring

An optimum simple ramp test-accelerated life test with two different linearly increasing stresses-is presented for the Weibull distribution under type I censoring. It is assumed that the inverse power law holds between the Weibull scale parameter and the constant stress and that the cumulative exposure model for the effect of changing stress applies. The optimum plan-low stress rate and proportion of test units allocated to low stress mode-is found. It minimizes the asymptotic variance of the maximum likelihood estimator of a stated quantile at design stress. For selected values of the design parameters, these optimum plans are tabulated, and the effect of the preestimates of these parameters are studied