• DocumentCode
    841265
  • Title

    Ultra-thin-channelled GaAs MESFET with double-δ-doped layers

  • Author

    Ishibashi, A. ; Funato, Kazuhiro ; Mori, Yojiro

  • Author_Institution
    Sony Corp. Res. Centre, Yokohama
  • Volume
    24
  • Issue
    16
  • fYear
    1988
  • fDate
    8/4/1988 12:00:00 AM
  • Firstpage
    1034
  • Lastpage
    1035
  • Abstract
    GaAs MESFETs with double-δ-doped layers have been fabricated with electron-beam-induced resist. The FET is made with the δ-doped channel embedded as shallow as 70 Å from the surface, and shows an intrinsic transconductance of 400 mS/mm for a gate length of about 1500 Å
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; doping profiles; gallium arsenide; 1500 Å; GaAs; MESFETs; double-δ-doped layers; electron-beam-induced resist; gate length; intrinsic transconductance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    191716