Title :
The distribution of transport current in YBCO coated conductor with zipper striations
Author :
Wang, L.B. ; Selby, P. ; Khanal, C. ; Levin, George ; Haugan, Timothy J. ; Barnes, Paul N. ; Kwon, C.
Author_Institution :
Dept. of Phys. & Astron., California State Univ., Long Beach, CA, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
An YBCO coated conductor with a zipper pattern striation is investigated by scanning laser microscopy (SLM). The distribution of transport current deduced from the VTSLM images shows that striations act as artificial barriers forcing the current to flow around them. Current sharing and redistribution are observed at the zipper area. We find the major dissipation mechanism in the sample in the superconducting state to be the current crowding at bottleneck areas. The bottleneck seems to be caused by the disabled filaments at and around the zipper area. Some filaments show the dissipation away from the zipper area. In general, we find that the lower Jc* areas have lower Tc* and high δVm, which we consider as a sign of the current crowding. For the first time, we have demonstrated that there is a high temperature signature of the lower Jc* (high dissipation) area and VTSLM can detect the signature.
Keywords :
barium compounds; critical current density (superconductivity); discharges (electric); scanning electron microscopy; superconducting tapes; yttrium compounds; SLM; VTSLM images; YBCO coated conductor; YBa2Cu3O7; critical current density; current redistribution; current sharing; dissipation mechanism; scanning laser microscopy; superconducting state; transport current; zipper pattern striation; Carbon capture and storage; Conductors; Extraterrestrial measurements; High temperature superconductors; Microscopy; Proximity effect; Strips; Superconducting epitaxial layers; Superconducting filaments and wires; Yttrium barium copper oxide; Critical current density; YBCO coated conductor; the distribution of transport current; zipper striations;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.848670