• DocumentCode
    841551
  • Title

    Imaging local dissipation and magnetic field in YBCO films with artificial defects

  • Author

    Abraimov, D.V. ; Feldmann, D.M. ; Polyanskii, A.A. ; Gurevich, A. ; Liao, S. ; Daniels, G. ; Larbalestier, D.C. ; Zhuravel, A.P. ; Ustinov, A.V.

  • Author_Institution
    Appl. Supercond. Center, Univ. of Wisconsin, Madison, WI, USA
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    2954
  • Lastpage
    2957
  • Abstract
    We used Low Temperature Laser Scanning Microscopy (LTLSM) to investigate dc current flow in high-Jc YBCO thin films with artificially prepared defects and correlated the LTLSM response to Magneto Optical Images (MOI). Artificial defects model current blockages such as cracks, high angle grain boundaries or voids. Because the LTLSM voltage response is associated with the local electric field, while MOI shows the local perpendicular magnetic field, the combination of techniques gives complementary local information about the effect of current-limiting defects in superconductors.
  • Keywords
    barium compounds; high-temperature superconductors; laser beam applications; magneto-optical effects; optical microscopy; superconducting thin films; yttrium compounds; LTLSM; MOI; YBCO thin films; YBaCuO; artificial defects; dc current flow; high angle grain boundaries; high-temperature superconductors; imaging local dissipation; laser applications; local electric field; local perpendicular magnetic field; low temperature laser scanning microscopy; magneto optical images; voltage response; Image motion analysis; Laser modes; Magnetic fields; Magnetic films; Magnetic force microscopy; Optical films; Optical imaging; Optical microscopy; Temperature; Yttrium barium copper oxide; High-temperature superconductors; laser applications; local electric field; local magnetic field; low temperature scanning laser microscopy; magneto optical imaging;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.848679
  • Filename
    1440288