DocumentCode
841560
Title
Control of lithography in semiconductor manufacturing
Author
Martinez, Victor M. ; Edgar, Thomas F.
Volume
26
Issue
6
fYear
2006
Firstpage
46
Lastpage
55
Abstract
Lithography is important in semiconductor manufacturing because it affects both the performance and yield of the devices in each wafer. The formation of a layer in lithography equipment involves a series of steps, each of which requires process control, namely, surface preparation, spin coat, soft bake, alignment and exposure, post-exposure bake, resist development, after-development inspection, resist removal, and final inspection. Lithography process control must address both chemical and mechanical aspects. In addition, the correct alignment of each layer must be obtained with respect to the previous layer and the overall alignment of the device. Advanced process control is used in various steps in lithography. For example, alignment and exposure may require multivariable model predictive control of a 10 times 10 system. Factory control of lithography equipment in a multiprocess/multiproduct environment requires special modifications for data handling and control since each tool has slightly different operating characteristics
Keywords
data handling; factory automation; lithography; multivariable control systems; predictive control; process control; semiconductor device manufacture; data handling; factory control; lithography process control; multivariable model predictive control; semiconductor manufacturing; Chemical processes; Data handling; Inspection; Lithography; Predictive control; Predictive models; Process control; Production facilities; Resists; Semiconductor device manufacture;
fLanguage
English
Journal_Title
Control Systems, IEEE
Publisher
ieee
ISSN
1066-033X
Type
jour
DOI
10.1109/MCS.2006.252811
Filename
4019321
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