DocumentCode
841914
Title
Upset Testing of LSI Devices
Author
Sivo, L.L. ; Andrews, J.L. ; Mathers, H.W.
Author_Institution
General Electric Company P. O. Box 8555 Philadelphia, Pennsylvania
Volume
26
Issue
6
fYear
1979
Firstpage
4778
Lastpage
4781
Abstract
A program is outlined to determine the lowest radiation upset levels or digital LSI devices. Upset levels can be sensitive to input conditions and an efficient strategy of testing is described, together with powerful instrumentation which meets the above objective. Some upsets can be internal to the device and found only by clocking through to an output. This instrumentation determines if upsets exist by comparison of outputs of device(s) under test with outputs of an unexposed (reference) device.
Keywords
Circuit testing; Clocks; Companies; Digital integrated circuits; Instruments; Large scale integration; Logic testing; Monitoring; Pulse circuits; Semiconductor device testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1979.4330227
Filename
4330227
Link To Document