DocumentCode
841975
Title
An Electrical Technique to Measure the Radiation Susceptibility of MOS Gate Insulators
Author
Boesch, H.E., Jr. ; McGarrity, J.M.
Author_Institution
U.S. Army Electronics Research and Development Command Harry Diamond Laboratories Adelphi, Maryland 20783
Volume
26
Issue
6
fYear
1979
Firstpage
4814
Lastpage
4818
Keywords
Charge carrier processes; Dielectrics and electrical insulation; Electric variables measurement; Electron traps; Impact ionization; Interface states; Ionizing radiation; MOS capacitors; Testing; Tunneling;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1979.4330233
Filename
4330233
Link To Document