Title :
Thermomechanical assessment of molding compounds
Author :
Selig, O. ; Alpern, P. ; Müller, K. ; Tilgner, R.
Author_Institution :
Siemens AG, Munchen, Germany
fDate :
8/1/1992 12:00:00 AM
Abstract :
A bending beam technique was used to classify different molding compounds by the shear stress exerted on the Si substrate. Production test chips encapsulated with these plastic materials were stressed by means of temperature cycling. The amount of mechanical degradation of the chips as determined after decapsulation turned out to be clearly correlated with the shear stress exerted by the plastic. Thus the bending beam technique allows the assessment of the components´ quality with respect to thermal cycling stress
Keywords :
encapsulation; materials testing; monolithic integrated circuits; packaging; polymers; silicon; thermal stresses; Si substrate; TCE; bending beam technique; coated Si beam test; mechanical degradation; molding compounds; shear stress exerted on Si; temperature cycling; thermal cycling stress; thermal expansion; thermomechanical assessment; Manufacturing; Metallization; Plastics; Silicon; Surface cracks; Temperature; Testing; Thermal expansion; Thermal stresses; Thermomechanical processes;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on