DocumentCode :
842050
Title :
Grain boundaries in multi-seeded melt-grown superconductors
Author :
Haindl, S. ; Eisterer, M. ; Weber, H.W. ; Babu, N. Hari ; Cardwell, D.A.
Author_Institution :
Atomic Inst. of the Austrian Univ., Vienna, Austria
Volume :
15
Issue :
2
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
3129
Lastpage :
3132
Abstract :
Future applications of high temperature superconductors require bulk materials of a complex shape. The multi-seeded-melt-growth process (MSMG) represents a promising technique for obtaining qualitatively well oriented bulk materials with different kinds of shape. In the MSMG process, several seeds are placed on a precursor pellet, from which the growth of the bulk starts. A certain problem of the MSMG process is that grain boundaries become inevitable when the growth fronts of two neighboring seeds collide. These grain boundaries are responsible for a reduction of the critical currents and pose a problem for high current applications. By polishing the sample step by step, the influence of the grain boundaries was investigated by scanning Hall probe measurements and by the magnetoscan technique. Additionally, optical microscopy and electron microscopy were employed to investigate the details of the microstructure.
Keywords :
Hall effect; critical current density (superconductivity); crystal growth from melt; electron microscopy; grain boundaries; high-temperature superconductors; optical microscopy; bulk materials; critical currents; electron microscopy; grain boundaries; high temperature superconductors; magnetoscan technique; multiseeded melt-grown superconductors; optical microscopy; precursor pellet; scanning Hall probe measurements; Critical current; Electron microscopy; Grain boundaries; Hall effect devices; High temperature superconductors; Optical microscopy; Shape; Superconducting magnets; Superconducting materials; Superconductivity; Grain boundaries; Hall probe measurements; MSMG;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2005.848978
Filename :
1440333
Link To Document :
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