DocumentCode :
842078
Title :
A 1.5-V 14-bit 100-MS/s self-calibrated DAC
Author :
Cong, Yonghua ; Geiger, Randall L.
Volume :
38
Issue :
12
fYear :
2003
Firstpage :
2051
Lastpage :
2060
Abstract :
Large-area current source arrays are widely used in current-steering digital-to-analog converters (DACs) to statistically maintain a required level of matching accuracy between the current sources. This not only results in large die size but also in significant degradation of dynamic range for high-frequency signals. To overcome technology barriers, relax requirements on the layout, and reduce DAC sensitivities to process, temperature, and aging, calibration is emerging as a viable solution for the next-generation high-performance DACs. In this paper, a new foreground calibration technique suitable for very-low-voltage environments is presented which effectively compensates for current source mismatch, and achieves high linearity with small die size and low power consumption. Settling and dynamic performance are also improved due to a dramatic reduction of parasitic effects. To demonstrate this technique, a 14-bit DAC prototype was implemented in a 0.13-μm digital CMOS process. This is the first CMOS DAC reported that operates with a single 1.5-V power supply and achieves 14-bit linearity with less than 0.1 mm2 of active area. At 100 MS/s, the spurious free dynamic range is 82 dB (62 dB) for signals of 0.9 MHz (42 MHz) and the power consumption is only 16.7 mW.
Keywords :
CMOS analogue integrated circuits; calibration; digital-analogue conversion; integrated circuit layout; 0.1 mm2 active area; 0.13-/xm digital CMOS process; 0.9 MHz; 1.5-V 14-bit 100-MS/s self-calibrated DAC; 1.5-V power supply; 100 MS/s; 14-bit DAC prototype; 14-bit linearity; 16.7 mW; 42 MHz; 62 dB; 82 dB; CMOS DAC; DAC sensitivity reduction; current source arrays; current source mismatch; current-steering digital-to-analog converters; die size; digital-to-analog converter; foreground calibration technique; high linearity; high-frequency signals; layout requirements; low voltage; next-generation high-performance DAC; parasitic effects; power consumption; self-calibration; spurious free dynamic range; technology barriers; very-low-voltage environments; Aging; CMOS process; Calibration; Degradation; Digital-analog conversion; Dynamic range; Energy consumption; Linearity; Prototypes; Temperature sensors;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.819163
Filename :
1253851
Link To Document :
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