DocumentCode :
842307
Title :
High-reflectivity AlAs0.52Sb0.48/GaInAs(P) distributed Bragg mirror on InP substrate for 1.3-1.55 mu m wavelengths
Author :
Tai, K. ; Cho, Andrew Y. ; Huang, K.F.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
25
Issue :
17
fYear :
1989
Firstpage :
1159
Lastpage :
1160
Abstract :
Periodic AlAs0.52Sb0.48/Ga0.47In0.53As quarter-wave distributed Bragg reflectors on InP substrates were prepared and with only eight pairs a peak reflectivity of 90% and a bandwidth of >or=0.2 mu m were measured. By the addition of P to the GaInAs alloy, this mirror structure would be useful for InP-based surface emitting laser application at 1.3-1.55 mu m wavelengths and would be superior to the previously studied GaInAsP/InP structure, where approximately 20 pairs are required to achieve similar reflection.
Keywords :
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; gallium compounds; indium compounds; integrated optics; laser cavity resonators; mirrors; reflectivity; semiconductor junction lasers; 1.3 to 1.55 micron; AlAs 0.52Sb 0.48-Ga 0.47In 0.5 3AsP; AlAs 0.52Sb 0.48-GaInAs-InP; InP substrates; InP-based surface emitting laser application; cavity resonators; distributed Bragg mirror; high-reflectivity mirror; integrated optics; quarter-wave distributed Bragg reflectors; semiconductor lasers;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19890778
Filename :
41929
Link To Document :
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