DocumentCode :
842542
Title :
High-Quality Transition Fault ATPG for Small Delay Defects
Author :
Vaseekar Kumar, Mahilchi Milir ; Tragoudas, Spyros
Volume :
26
Issue :
5
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
983
Lastpage :
989
Abstract :
A new framework is proposed to generate compact quality tests to detect small delay defects by activating and propagating transition faults only along implicitly kept sensitizable critical paths. It is shown how to implicitly generate functions to derive tests for the proposed framework. The novelty of the method relies on a multivalued algebra that is used to generate the test functions with a single circuit traversal, independent of the number of critical paths. Experimental results demonstrate the effectiveness of the method
Keywords :
Boolean algebra; automatic test pattern generation; delays; logic testing; multivalued logic; algebraic test generation; automatic test pattern generation; compact quality tests; delay faults; high-quality transition fault ATPG; multivalued algebra; small delay defects; Algebra; Automatic test pattern generation; Circuit faults; Circuit testing; Delay effects; Electrical fault detection; Fault detection; Manufacturing; Propagation delay; Test pattern generators; Automatic test pattern generation (ATPG); Boolean/algebraic test generation; delay faults; testing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2006.884863
Filename :
4193574
Link To Document :
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