• DocumentCode
    842552
  • Title

    Picosecond electrical sampling using a scanning force microscope

  • Author

    Hou, A.S. ; Ho, F. ; Bloom, D.M.

  • Author_Institution
    Edward L. Ginzton Lab., Stanford Univ., CA, USA
  • Volume
    28
  • Issue
    25
  • fYear
    1992
  • Firstpage
    2302
  • Lastpage
    2303
  • Abstract
    A scanning force microscope probe for measuring ultrafast voltage signals is demonstrated. The new technique is based on mixing due to the square-law force interaction present between the microscope tip and sample. Correlation of 100 ps pulses and mixing up to 20 GHz have been achieved.
  • Keywords
    atomic force microscopy; microwave measurement; probes; scanning electron microscopy; voltage measurement; 1 to 20 GHz; 100 ps; SFM probe; mixing; picosecond electrical sampling; scanning force microscope; square-law force interaction; ultrafast voltage signals;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19921481
  • Filename
    191839
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=842552