• DocumentCode
    842601
  • Title

    Innovative passivated heterojunction bipolar transistor grown by CBE

  • Author

    Dubon-Chevallier, C. ; Alexandre, F. ; Benchimol, J.L. ; Dangla, J. ; Amarger, V. ; Heliot, Fabien ; Bourguiga, R.

  • Author_Institution
    France Telecom, CNET, Bagneux, France
  • Volume
    28
  • Issue
    25
  • fYear
    1992
  • Firstpage
    2308
  • Lastpage
    2309
  • Abstract
    An innovative passivated heterojunction bipolar transistor structure, which enables with the same technological step both base surface passivation and emitter selective etching to be obtained, is reported. This new structure employs an emitter comprising two layers, a thin GaInP layer and a GaAlAs layer.
  • Keywords
    III-V semiconductors; aluminium compounds; chemical beam epitaxial growth; etching; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; passivation; semiconductor growth; CBE growth; GaAlAs-GaInP-GaAs; GaAs substrate; base surface passivation; emitter selective etching; heterojunction bipolar transistor; passivated HBT;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19921485
  • Filename
    191843