DocumentCode
842969
Title
Critical currents of Nb3Sn wire subject to applied transverse stress
Author
Kitaguchi, Hitoshi ; Kimura, Satoshi ; Shimonosono, Tsutomu ; Hanai, Satoshi ; Takeuchi, Takao ; Inoue, Kiyoshi
Author_Institution
Oxide Supercond. Wires Group, Nat. Inst. for Mater. Sci., Tsukuba, Japan
Volume
15
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
3454
Lastpage
3457
Abstract
We investigated the influence of transverse stress on the critical current, Ic. We tested a Nb3Sn, wire fabricated thorough the powder-in-tube route, mainly at 16 K and 2 T. In the stress window of 0-42 MPa, a reversible relation was confirmed between Ic and the compressive stress, σt. After a slight increase of Ic at very small σ, Ic decreases with further increase of σt. When we unloaded within this stress window, Ic recovered to its virgin loading curve. Ic is more sensitive on σt in this work than in the Ic-σt relations reported so far. This can be attributed to the lower Bc2 at 16 K (3.8 T by Kramer´s extrapolation) and possibly a nonuniform stress distribution in the present work. σt greater than 49 MPa caused an irreversible Ic degradation due to a plastic deformation of the filaments.
Keywords
compressibility; compressive strength; compressive testing; critical current density (superconductivity); multifilamentary superconductors; stress-strain relations; superconducting tapes; tensile testing; 0 to 42 MPa; 16 K; 2 T; 3.8 T; Nb3Sn; Nb3Sn wire; compressive stress; critical currents; plastic deformation; strain effects; stress distribution; superconducting filaments; superconducting materials measurements; superconducting wires; transverse stress; Compressive stress; Critical current; Electrodes; Hydraulic actuators; Magnetic field induced strain; Magnetic heads; Sliding mode control; Superconducting filaments and wires; Testing; Tin; Critical currents; strain effects; superconducting filaments and wires; superconducting materials measurements;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2005.849056
Filename
1440415
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